Solar photovoltaic cell and module manufacturing involves multiple high-throughput and complex processes, spanning wafer texturization, diffusion, PSG removal, PECVD, metallization, firing, final cell and subsequent module operations such as cell half-cutting, stringing, lamination, EL inspection, and framing. Despite high levels of automation, the industry continues to face a fundamental limitation: the inability to maintain persistent, cell-level traceability across the complete manufacturing lifecycle. Existing traceability mechanisms such as Virtual Serial Numbers (VSN), batch IDs, stack-level barcodes, and manual line travelers are module-centric and post-facto, resulting in loss of individual cell identity, particularly after laser half-cut operations in cells. Consequently, manufacturers experience 5-10% traceability mismatches, weak cell-to-module lineage during rework and warranty analysis, statistically driven (rather than deterministic) defect attribution, and limited ability to link field failures back to specific manufacturing parameters, thereby constraining root-cause analysis, counterfeit detection, recall management, and long-term reliability assurance.
We are looking for a solution that is non-invasive, complex-resilient, and capable of uniquely identifying every solar cell at critical process milestones without impacting throughput, efficiency, aesthetics, or reliability and preserves identity continuity through chemical, thermal, mechanical, and laser half-cut transformations. The system must track the path from full cell → half cell → string → final module and link it to module serial numbers, EL/IV (Electroluminescence/Current-Voltage) data, and warranty records.
Note: Approaches such as barcode printing or laser marking on solar cells are not feasible, as they can reduce cell efficiency and therefore cannot be considered practical options.
Awards:-
Deadline:- 09-05-2026
